Embedded Executive: Understand The Accuracy Required in Semiconductor Manufacturing with Heidenhain

By Rich Nass

Contributing Editor

Embedded Computing Design

March 20, 2024

Podcast

Embedded Executive: Understand The Accuracy Required in Semiconductor Manufacturing with Heidenhain

Do you understand the metrology that applies to semiconductor manufacturing? I know I certainly didn’t, and found out how little I knew about this essential technology when I spoke to David Doyle, the President and Managing Director of Heidenhain Corp.
 

While mostly applying to semiconductors, the technology can be deployed on any manufacturing platform. But semiconductor manufacturing has to be so precise, and that’s putting it mildly, that things are measured in terms of microns and nanometers.

Check out this week’s Embedded Executives podcast. to get the baseline understanding on how important this technology is to our semiconductor industry.

 

Rich Nass is a regular contributor to Embedded Computing Design. He has appeared on more than 500 episodes of the popular Embedded Executive podcast series, and is a regular contributor to the Embedded Insiders podcast.

Rich has been in the engineering OEM industry for more than 35 years, and is a recognized expert in the areas of embedded computing, Edge AI, industrial computing, the IoT, and cyber-resiliency and safety and security issues. He writes and speaks regularly on these topics and more.

Rich is currently the Liaison to Industry for the Embedded World North America Exhibition and Conference, and has held similar positions with the global Embedded World Conference and Exhibition.

Previously, Rich was the Brand Director for UBM’s award-winning Design News property. Prior to that, he led the content team for UBM Canon’s Medical Devices Group, as well all custom properties and events.  In prior stints, he led the Content Team at EE Times, handling the Embedded and Custom groups and the TechOnline DesignLine network of design engineering web sites.

Nass holds a BSEE degree from the New Jersey Institute of Technology.

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