Keysight Technologies, FormFactor, and CompoundTek have joined forces to accelerate integrated photonics innovations. While photonics integrated circuits (PICs) offer an alternative to the limitations of traditional data center networking, they also introduce new design and test challenges for component and device manufacturers. Adoption of PICs is primarily dependent on an industrial ecosystem comprised of new foundries, commercial modeling tools, and photonic test capabilities.

Keysight, FormFactor and CompoundTek, have jointly developed an advanced photonics on-wafer testing solution that delivers industry-first capabilities including automated alignment, simultaneous optical-optical and optical-electrical device tests. The joint solution, to be offered by CompoundTek includes the FormFactor CM300xi-SiPh, with automated wafer level photonics positioning, combined with Keysight’s IL/PDL engines and N7700A Photonics Application Suite (PAS), to support wavelength repeatability of ±1.5 pm at two-way sweeps up to 200 nm/s within 1240nm to 1650nm to ensure accuracy and repeatability from O-band to L-band.

Keysight’s N4373E 67 GHz Lightwave Component Analyzer serves both optical receiver testing and optical transmitter testing with guaranteed specifications for electro-optical S-parameter measurements for device traceability. FormFactor’s SiPh software enables automated calibrations and alignments, and simplifies integration with Keysight’s PathWave software platform, as well as optical instrumentation.

For more information, visit www.keysight.com