Practical Guide to Maximizing DC Measurement Performance

November 28, 2018

Whitepaper

Practical Guide to Maximizing DC Measurement Performance

The various methods covered in this guide can help you achieve greater accuracy in your applications requiring DC measurements.


Taking quality DC measurements is a cornerstone of testing semiconductor chips. Learn how you can improve measurement accuracy and product quality for power management ICs, RF power amplifiers, and other ICs by implementing these foundational best practices. This guide includes the following topics: 

  • Source measure unit theory of operation
  • Measurement accuracy
  • Accuracy versus speed trade-off
  • The effects of pulsing
  • Using remote sense to offset the effects of lead resistance
  • Compensating for offset voltage
  • Minimizing external noise
  • Guarding against leakage current
  • Understanding the importance of calibration 

Ready to view and download this whitepaper?













Read our Privacy Policy to understand what data we collect, why we collect it, and what we do with it. You may receive a request for your feedback from OpenSystems Media.

Tech News Roundup
MORE