Senseeker Expands Neon IC Family for SWIR Applications

By Ken Briodagh

Editor in Chief

Embedded Computing Design

July 17, 2024

News

Senseeker Expands Neon IC Family for SWIR Applications

In a recent release, Senseeker, a company specializing in fabless semiconductor and cryogenic test solutions for digital imaging, announced that its new Neon RD0131 is now available.

The RD0131 advanced digital readout integrated circuit (DROIC) expands the Neon product family with the addition of a high definition 1280 x 1024 format.

"The new larger format size of the Neon RD0131 is a welcome addition to the Neon DROIC family,” said Dr. Martin H. Ettenberg, President and CEO, Princeton Infrared Technologies. “Senseeker’s approach to offering families of compatible products allows reuse of test equipment, electronics and software, greatly simplifying the development of new high-performance SWIR cameras and imagers that we provide for the Industrial, Scientific and Defense markets.”

The Neon RD0131 has been designed with a 1280 x 1024 format and 10 µm pitch, according to the announcement. It also has triple-gain modes with programmable well capacities of 22 ke-, 160 ke- and 1.1 Me-. The DROIC supports a read noise of 15 electrons at room temperature in high-gain, the company said.

“The Neon RD0131 CTIA DROIC is the second chip in our Neon product family that has proven to be a hit with customers that are developing solutions for low-light applications such as short-wave infrared (SWIR) and low-current technologies such as quantum dot-based detectors,” said Kenton Veeder, President, Senseeker. “We have included the popular features and operating modes that Senseeker is known for, including on-chip temperature monitoring and programmable multiple high-speed windows to observe and track targets at thousands of frames per second.”

The Neon RD0131 reportedly is available in full or quarter wafers now and is supported by Senseeker’s CoaxSTACK electronics kit, CamIRa imaging software and sensor test units (STUs) that, together, enable testing and evaluation of Neon-based focal plane arrays quickly and efficiently. Check it out here.

Ken Briodagh is a writer and editor with two decades of experience under his belt. He is in love with technology and if he had his druthers, he would beta test everything from shoe phones to flying cars.

At Embedded Computing Design, he covers, AI, Edge Computing, Data Centers, Automotive, Industrial, Smart City, IoT and IIoT, Semiconductors, Healthcare, and lots more. He hosts weekly programs on YouTube, including the technology unboxing feature DevKit Weekly, and his news show ICYMI, and, along with Tiera Oliver, hosts the Embedded Insiders and Embedded Executive podcasts. 

In previous lives, he’s been a short order cook, telemarketer, medical supply technician, mover of the bodies at a funeral home, pirate, poet, partial alliterist, parent, partner and pretender to various thrones. Most of his exploits are either exaggerated or blatantly false.

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