A Precision Timing Solution for Tesla's Dojo System from SiTime

Chad Cox

October 5, 2022

RIGOL Releases its DP2000 Bench Top Power Supply

Chad Cox

September 29, 2022

Every Penny Counts in Embedded Design

Shawn Prestridge

September 21, 2022

SEGGER Device Support Kit Simplifies Adding New Silicon to J-Link, Flasher Tools

Tiera Oliver

September 13, 2022

SEGGER and Geehy Partner to Fully Support the APM32 Series MCU

Tiera Oliver

September 12, 2022

How MQTT on Narrowband-IoT Can Ruin Your Project

Fabian Kochem

September 2, 2022

Embedded Toolbox: Fuzzing Out Bugs in Safety-Critical Embedded Software

Embedded Computing Design Staff

September 1, 2022

On average, software engineers spend 20-25 percent of the development lifecycle on testing, and potentially much more when working on safety-critical systems. The worst part may be that your standard unit tests aren’t able to provide 100% code coverage.

Rohde & Schwarz Releases UWB Test Solution Certified for FiRa Consortium PHY Conformance

Chad Cox

August 19, 2022

Rohde & Schwarz Announces R&S ESW EMI Test Receiver with a Bandwidth Increase of 1GHZ

Chad Cox

August 18, 2022

Spirent “Send Us Your Device” Service Enables New Routes For Wi-Fi Equipment Testing

Taryn Engmark

August 10, 2022

Rohde & Schwarz Announces Comprehensive Test Solutions for 5G NR Release 17

Tiera Oliver

August 3, 2022

Keysight Collaborates with Nokia to Demonstrate the First 800 Gigabit Ethernet Readiness and Interoperability Public Test

Tiera Oliver

August 3, 2022

Dev Kit Weekly: STMicro's STM32U5 NUCLEO-144 Evaluation Board

Brandon Lewis

July 29, 2022

Here’s what you’ll need if you want to build an industrial IoT sensor node:

• The intelligence to convert, filter, and in some cases analyze, analog signals at the edge
• Enough efficiency to run for long periods on minimal resources
• Some amount of connectivity
• And because of that, local security

Oh yeah, you’ll probably want to start thinking about compliance with safety standards like IEC 61508, too.

Keysight Introduces Cloud-Based End-to-End Open RAN Architect Test Solutions

Keysight Technologies, Inc.

AWS

July 20, 2022

Rohde & Schwarz Announces On-Wafer Device Characterization Test Solution

Rohde & Schwarz

July 20, 2022

The Importance of Regression Testing

Toral Mevada

July 18, 2022

PLS' UDE Enables Multicore Debugging and Trace for New NXP S32Z and S32E Real-Time Processors

Tiera Oliver

July 18, 2022

Newark Now Stocking the Next Generation Tektronix 2 Series MSO

Newark

Tektronix

July 12, 2022

Considerations for Inductor Simulation Models

Coilcraft

July 1, 2022

Texas Instruments New Bluetooth LE Wireless MCUs Make High-Quality RF and Power Performance More Affordable

Tiera Oliver

July 1, 2022

Solid Sands and SYSGO Expand Their Collaboration to Assist Customers with Safety-Critical Projects

Chad Cox

June 27, 2022

My Debugger Now Talks to VS Code

Rich Nass

June 20, 2022

Embedded Computing Design Hits a High Note at embedded world 2022

Embedded Computing Design Staff

June 17, 2022